Micro-Ellipso-Height-Profilometry
K. Leonhardt, H.-J. Jordan and H.J. Tiziani, Institut for Technical Optic of the University of Stuttgart, Jan. 1991, Optic Communications,
Vol 80 No 3,4, Seite 205.

Topic: Microtriangulation (Microprofilometry) with Compensation of the influences of local surface slopes, in a beam path combined with micro-ellipsometry.

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Contactless resistivity measurements on small platelets

Wolfgang Bauhofer and Hans-Joachim Jordan, Max-Planck-Institut for Solid State Research, Stuttgart, 1982, J. Phys. E: Sci. Instrum., Vol. 15, Seite 419.

Topics:

• Also non-contact measurement technology, but not optical.
• Non-contact electrical conductivity measurement on small, air-sensitive crystals.